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31.01.2017:
Information about VISA arrangements

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31.01.2017:
Official: 11 full papers, 3 short ones and 2 extended abstracts were accepted for inclusion in the IWCT program out of 27 submissions.

more details ...

09.12.2017:
Submission deadline extended

13.10.2016:
Official: the workshop has been accepted for ICST. See you in Japan!

29.09.2016:
Workshop proposal submitted

16.09.2016:
Web site for the proposal is up and running

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Organizing Committee

Steering Committee

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titles wordle

IWCT 2017 – Program

Note: Full and short papers are allocated 25 and 15 mins for presentation, respectively. (including 5 mins Q&A)

Welcome to IWCT [slides]

Session 1: Test Case Generation & Quality Assessment

(Duration: 09.00 - 10.40)

  1. Estimating t-way Fault Profile Evolution During Testing
    D. Richard Kuhn, Raghu N. Kacker and Jeff Lei
    [slides]
  2. Mutation Score, Coverage, Model Inference: Quality Assessment For t-way Combinatorial Test-Suites
    Hermann Felbinger, Franz Wotawa and Mihai Nica
    [slides]
  3. Optimizing IPOG’s Vertical Growth with Constraints Based on Hypergraph Coloring
    Feng Duan, Yu Lei, Linbin Yu, Raghu N. Kacker and D. Richard Kuhn
    [slides]
  4. Test Case Generation with Regular Expressions and Combinatorial Techniques
    Macario Polo, Francisco Ruiz Romero, Rosana Rodríguez-Bobada Aranda and Ignacio García-Rodríguez

Coffee break: 10.40 - 11.00

Session 2: Applications of Combinatorial Testing: I

(Duration: 11.00 - 12.05)

  1. Applying Combinatorial Testing to High-Speed Railway Track Circuit Receiver
    Chang Rao, Jin Guo, Nan Li, Jeff Lei, Yadong Zhang, Yao Li and Yaxin Cao
    [slides]
  2. Applications of Practical Combinatorial Testing Methods at Siemens Industry Inc.
    Murat Ozcan
    [slides]
  3. Using Timed Base-Choice Coverage Criterion for Testing Industrial Control Software (short 15 mins)
    Bergstrom and Eduard Enoiu
    [slides]

Session 3: Poster Session

(Duration: 12.05 - 12.30, continued during lunch)

  1. Finding Minimum Locating Arrays Using a SAT Solver
    Tatsuya Konishi, Hideharu Kojima, Hiroyuki Nakagawa and Tatsuhiro Tsuchiya
    [slides]
  2. Test Optimisation using Combinatorial Test Design
    Saritha Route
    [slides]

Lunch: 12.30 - 14.00

Session 4: Modelling

(Duration: 14.00 - 15.30)

  1. Building Combinatorial Test Input Model from Use Case Artefacts
    Preeti S, Milind B, Medhini S. Narayan and Krishnan Rangarajan
    [slides]
  2. Combinatorial Methods for Modelling Composed Software Systems
    Ludwig Kampel, Bernhard Garn and Dimitris E. Simos
    [slides]
  3. Combinatorial Interaction Testing for Automated Constraint Repair
    Angelo Gargantini, Justyna Petke and Marco Radavelli
    [slides]
  4. A composition-based method for combinatorial test design (short 15 mins)
    Anna Zamansky, Eitan Farchi, Sery Khoury and Amir Schwartz
    [slides]

Coffee break: 15.30 - 16.00

Session 5: Applications of Combinatorial Testing: II

(Duration: 16.00 - 17.05)

  1. Applying Combinatorial Testing to Data Mining Algorithms
    Jaganmohan Chandrasekaran, Huadong Feng, Yu Lei, D. Richard Kuhn and Raghu N. Kacker
    [slides]
  2. Combinatorial Testing on Implementations of HTML5 Support
    Xi Deng, Tianyong Wu, Jun Yan and Jian Zhang
    [slides]
  3. Combinatorial Testing on MP3 for Audio Players (short 15 mins)
    Shaojiang Wang, Tianyong Wu, Yuan Yao, Beihong Jin and Liping Ding
    [slides]

IWCT Organizing & Steering Committee Meeting

(Duration: 17.20 - 18.00)

Note: It is strongly advised to take care of your VISA arrangements to Japan as soon as possible. For further information, please consult the main ICST website here